The fabricated annular pupils were inspected by scanning ion beam microscopy and scanning electron microscopy.
The surface topography of the PDMS substrates was verified by atomic force microscopy and scanning electron microscopy as previously shown42.
Principles and applications of imaging techniques for materials characterization including transmission and scanning electron microscopy and scanning probe microscopy.
Mohn, F., Schuler, B., Gross, L. & Meyer, G. Different tips for high-resolution atomic force microscopy and scanning tunneling microscopy of single molecules.
All the specimens were processed for fluorescence and light microscopy, and scanning electron microscopy.
Electrospun mats of these materials were characterized via optical microscopy and scanning electron microscopy.
Surface roughness was examined using atomic force microscopy and scanning electron microscopy.
The evolution of microstructure is characterized using transmission electron microscopy and scanning electron microscopy.
The fibrous coatings morphology was evaluated by optical microscopy and scanning electron microscopy.
Structural changes were assessed from optical microscopy and scanning electron microscopy.
Phase constituents and microstructure were characterized using X-ray diffractometer, optical microscopy, and scanning electron microscopy.
