Sentence examples for microscopy and focused from inspiring English sources
The physical film morphology was studied by electron microscopy and focused ion beam.
Particle morphology was assessed qualitatively using field emission scanning electron microscopy and focused ion beam-helium ion microscopy.
Filling experiments were evaluated by analyzing cross-sections of filled vias with scanning electron microscopy and focused ion beam.
Electron microscopy and focused ion beam milling studies demonstrate that the fibers are comprised of a carbon sheath and a silicon oxide core.
Using Raman spectroscopy, atomic force microscopy and focused ion beam (FIB) cross-sections, we show that hydrothermal degradation induces t m phase transformation and microcracking under the surface.
The changes in the microstructure of Au NP films after sintering were studied using the field emission scanning electron microscopy, X-ray diffractometry, atomic force microscopy and focused ion beam analysis.
The morphology of the zinc layers on Cu has been characterised by scanning electron microscopy and focussed ion beam.
For this end, several imaging techniques and modelling methods are utilized to characterize the shale pores, such as nano-CT, field emission and scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM), and focused ion beams and scanning electron microscopy (FIB-SEM) (Loucks et al. 2009; Bernard et al. 2012; Chalmers et al. 2012a, b; Curtis et al. 2012; Milliken et al. 2013).
The resulting structures were analyzed by atomic force microscopy (AFM) and focused ion beam cuts in combination with scanning electron microscopy (FIB-SEM).
Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB) are suitable techniques for studying the interface at the nanoscale.
To overcome the macroscopic defects and rough interface between the BaTiO3 films and substrates, the influence of starting powders with difference particle sizes was investigated by scanning electron microscopy (SEM) and focused ion beam (FIB).
