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After chemical mechanical polishing the structures were characterized by scanning electron microscopy and electrical measurements.
Optical microscopy and electrical measurements confirm the continuity of these films.
Characterization of the complexes by powder X-ray diffraction, scanning electron microscopy and electrical conductivity is presented.
Raman spectroscopy, scanning electron microscopy, transmission electron microscopy, and electrical characterization suggest that SWCNTs are completely wrapped by GO nano-sheets.
Raman spectroscopy, UV Vis spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and electrical transport measurements were used for an initial characterization of the synthesized graphene films.
The resulting microstructures were then characterized using a range of characterization techniques, including optical and electron microscopy, electron micro probe analysis, field emission gun scanning electron microscopy, and electrical resistivity measurements.
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These films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and electrical measurement systems.
Electron microscopy, rheology and electrical resistivity were used to characterize the morphology and microstructure.
This allows a physical correlation to be established for transmission electron microscopy inspection and electrical characterization.
We identify the graphene/HfO2 formation by Raman, X-ray photoelectron spectroscopy (XPS), Low energy electron diffraction (LEED), Low energy electron microscopy (LEEM) and electrical properties including Hall mobility and leakage current measurement.
Coffey, T; Seredinski, A; Poler, JN; Patteson, C Wattss, WH; Baptiste, K; Zheng, C; Cody, J; Collison, CJ, Nanoscale characterization of squaraine-fullerene-based photovoltaic active layers by atomic force microscopy mechanical and electrical property mapping, Thin Solid Films, vol. 669 (January, 2019), pp. 120-132, Elsevier BV [doi].
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