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Scanning tunneling microscopy and atomic force microscopy on organic biomolecules.
The GaN layers thus obtained were characterized using X-Ray diffraction, scanning electron microscopy, and atomic force microscopy.
Physical characterization of the microstructures was done using scanning electron microscopy and atomic force microscopy.
To tackle these issues, we combined electron microscope tomography, immuno-electron microscopy and atomic force microscopy.
This patterns are observed by reflection second harmonic generation microscopy and atomic force microscopy.
Additionally, scanning electron microscopy and atomic force microscopy were used for visualization.
Microstructural assessment was performed using scanning electron microscopy and atomic force microscopy (AFM).
These structures were investigated by scanning electron microscopy and atomic force microscopy.
Scanning electron microscopy and atomic force microscopy confirmed the microtopographical changes of membrane surfaces.
Transmission electron microscopy and atomic force microscopy observations confirmed particle size found by dynamic light scattering.
Scanning electron microscopy and atomic force microscopy are used to characterize the sensor electrodes.
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