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Light microscopic images were captured using a Zeiss AxioPhot microscope with an AxioCam 105 color camera.
Transmission electron microscopic (TEM) images are obtained on a JEOL 2010 microscope with an accelerating voltage of 200 kV.
Microscopic scoring was performed manually with an Olympus BX60 fluorescence microscope with an Olympus × 100/1.30 oil lens.
It was clearly of a compound microscope, with an eyepiece and an objective lens.
Images were taken with an OLYMPUS BX51 microscope with an UPlanFL N digital camera.
Raman measurements were conducted using Nanophoton Raman-11 microscope with an ultra-high speed imaging capability.
A Philips CM 12 (Amsterdam, Netherlands) microscope with an acceleration voltage of 120 kV was used.
Conventional optical microscope with an air lens cannot image the SPP mode.
SEM images were taken with Zeiss-DSM 960A microscope with an attached camera.
Transmission electron microscopy (TEM) measurements were taken on a Hitachi-600 electron microscope, with an accelerating voltage of 100 kV.
Raman scattering spectra were measured by a Renishaw inVia Raman microscope with an argon laser (λ, 514.5 nm) excitation.
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CEO of Professional Science Editing for Scientists @ prosciediting.com