The microscopes used in scanning microscopes are the atomic force microscope, laser force microscope, magnetic force microscope, electrostatic force microscope, scanning thermal microscope, scanning ion conductance microscope, and near-field scanning optical microscope.
An image analysis entails acquisition of images via a microscope (optical microscope, scanning electron microscope (SEM), etc).
Here we examined the eggshell of chicken Gallus domesticus by optical microscope, scanning electron microscope and transmission electron microscope.
The coupons were characterized by an optical microscope, scanning electron microscope, tensile and hardness tests, and fracture analysis.
The induced damage width, geometries and microstructure changes are analyzed with optical microscope, scanning electron microscope and Raman spectroscopy.
Meanwhile, the shape and the number of carbides in the different specimens were detected by using optical microscope, scanning electron microscope (SEM) & energy dispersive spectrometer (EDS).
The whole preparation process was monitored by transmission electron microscope, scanning electron microscope, Fourier transform infrared, Raman spectroscopy, dynamic light scattering, and thermogravimetry.
Single crystalline Si grains with an average size of 10 μm were obtained and further characterized by an optical microscope, scanning electronic microscope (SEM) and Raman spectrometer.
Optical microscope, scanning electron microscope equipped with energy dispersive spectroscopy (EDS) analysis, and X-ray diffraction were used to characterize the microstructure and composition of the nitrided layers.
All irradiated surfaces were characterized using Talysurf surface profiler, atomic force microscope, scanning electron microscope and energy dispersive X-ray spectrometer.
Characterization of the castings was performed by using an optical microscope, scanning electron microscopy, energy dispersive spectrometry, and X-ray diffraction analysis.
