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The method was thoroughly validated using a variety of cell lines, microscope models and imaging conditions, demonstrating consistently high segmentation performance in all cases and very short processing times (<1 s per 1,208 × 960 pixels image).
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Tissue sections were visualized using an Olympus FluroView laser scanning confocal microscope (Model IX70) and captured at ambient temperature using an Olympus camera (Model FV5-ZM) and Fluoview 5.0 acquisition software.
Images were obtained using a light microscope (model BX61; Olympus) and Cell^D 2.6 imaging software.
A field emission scanning electron microscope (model: MV2300, CamScan, Czech and England) and an atomic force microscope (AFM; Auto Probe PC, Park Scientific Instrument, Santa Clara, CA, USA) were also employed for investigation of chemical composition and surface morphology of the samples, respectively.
The surface morphology, functional groups and lattice/crystalline structure of the samples were determined using model Zeiss Evo®MA 15 EDX/WDS microscope, Model 470/670/870 Thermo Nicolet Nexus unit and PHILIPS X PERT X-RAY unit, respectively.
Surface morphological structure was investigated by using an LCD digital microscope (model 44340, Celestron, USA) and an atomic force microscope AFM (model EasyScan II, Nanosurf Instruments, Switzerland) using the taping mode (256 × 256 pixels), under ambient conditions.
Optical micrographs were performed with an Optika Microscope model XD-3MET at 500× and 1000×.
The photomicrographs were taken for the obtained nematodes using Olympus light microscope attached with a camera model HBS (HB2) and digital microscope model Olympus CX41.
Fluorescent microscope model was Nikon, Eclipse E400 and the software was SPOT advanced version 3.5.5 by Diagnostic Instruments Inc. (Sterling Heights, MI, USA).
During these incubations, HUVEC morphological changes were monitored using an inverted phase-contrast microscope (Model IX 70; Olympus, Tokyo, Japan) and photographs were obtained.
Sample imaging was carried out using a scanning electron microscope model JSM 5900LV (Jeol, Japan) and Quanta 650-FEG (FEI, USA) from the National Laboratory of Nanotecnology (LNNano-CNPEM) in Campinas-SP.
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