Sentence examples for microscope measurements were from inspiring English sources

SEM (Scanning electron microscope) measurements were confirming the figuration of a protective metal surface.

Atomic force microscope measurements were carried out to confirm the presence of single- and few-layer graphene by measuring step height [7].

After calibrating the microscope, measurements were made with an individual pixel resolution of 175 grey levels.

Microscope measurements were performed using a Philips CM30 TEM Philips FEII, Eindhoven, The Netherlands) operating at 300 kV.

For materials with porous morphology, scanning probe microscope measurements are limited, because the local probe can only measure structures which are accessible from the top of the sample.

Atomic force microscope measurements are used to form images from matching sides of a separated interface and to compare groove profiles with the solution of Mullins.

Transmission electron microscope (TEM) measurements were taken on a JEOL-2100F transmission electron microscope at 200 kV (Hitachi, Japan).

Laser-scanning confocal microscope fluorescence measurements were carried out using a Leica TCS SP5 confocal microscope using a 10× objective.

In order to investigate the morphology and thickness of the compact layers, scanning electron microscope (SEM) measurements were performed.

Transmission electron microscope (TEM) measurements were performed on a TEM instrument (JEOL model 2100, JEOL Ltd., Tokyo, Japan) operated at 190 V of 200 kV.

Atomic force microscope (AFM) measurements were carried out in the tapping mode with a Nanoscope IV instrument to confirm the shape of micelles.