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The petrologic polarizing microscope is used for classifying lava types and for tracing their general mineralogical history.
A scanning electron microscope is used to study the worn diamond wire, machined surfaces, and debris.
In our design piezoelectric tuning fork equipped with metallic tip in shear force microscope is used.
A scanning electron microscope is used for visual inspection of the structures produced.
While scanning electron microscope is used to observe the surface morphology of the crystals.
An atomic force microscope is used to measure the molecular forces between two carbon monoxide (CO) molecules.
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On the contrary, the here shown scattering microscope is using an unidirectional illumination beam.
For light microscopical analyses, a Leica CTR 6000 Microscope was used.
Compound microscope was used for phytoplankton counting.
A Nikon-A1 fluorescence microscope was used for image acquisition.
Tescan Mira 3 LMU SEM microscope was used.
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