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Transmission electron microscopic (TEM) studies were done by employing TECHNI 20 G2 microscope at an accelerating voltage 200 KeV.
High-resolution transmission electron microscopic (HRTEM) images were obtained for all samples using a JEOLTEM-2100 F microscope at an accelerating voltage of 200 kV.
Transmission electron microscope (TEM) images were taken with a Hitachi H-7650 microscope at an acceleration voltage of 100 kV.
SEM micrographs were taken on a LEO Gemini 1530 scanning electron microscope at an accelerating voltage of 5.80 kV.
Transmission electron microscopy (TEM) images were obtained using a FEI Tecnai G2 microscope at an acceleration voltage of 200 kV.
Transmission electron microscopy (TEM) images were captured using JEOL-3010 microscope at an accelerated voltage of 200 kV.
Cells were observed with scanning electron microscope at an acceleration voltage of 20 kV and images recorded.
Transmission electron microscopy was carried out using a JEOL100CX transmission electron microscope at an acceleration voltage of 100 KeV.
Transmission electron microscopy (TEM) images obtained with Selmi TEM-125 K microscope at an accelerating voltage of 80.00 kV.
The high-resolution transmission electron microscopy (HRTEM) characterization was carried out on a Tecnai F30 microscope at an accelerating voltage of 300 kV.
A surface morphology of PEI/TiO2 thin films was studied by scanning electron microscopy using a Philips XL30 microscope at an accelerating voltage of 20 kV.
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