Sentence examples for microscope and atomic from inspiring English sources
The surface morphology of the films was observed using scanning electron microscopy (SEM) on a LEO 1530 Scanning Electron Microscope, and atomic force microscopic (AFM) images for the films were obtained from a Nanoscope IIIa setup.
In some of our previous reports [ 32– 34], it was also observed that antimicrobial activity of essential oils was higher in vapour phase than in liquid phase, which was observed by different microscopic techniques: scanning electron microscope, transmission electron microscope, and atomic force microscope.
The self-assembled aggregates were characterized with a combination of conventional transmission electron microscope and atomic force microscope techniques.
The morphology of the SnSe2/MoSe2 vertical heterostructures is observed by optical microscope and atomic force microscope.
The surface morphology, topography & roughness of the diamond films were analysed using scanning electron microscope and atomic force microscope respectively.
Light interferometric surface profiler, scanning electron microscope and atomic force microscope were used to study these modifications, and these studies indicate the significant ablation and resolidification have occurred.
For the study of material science, some of the most powerful families of instruments used are the aberration-corrected scanning transmission electron microscope (STEM), the scanning tunnelling microscope (STM) and atomic force microscope (AFM).
Finally, damage morphologies and film cross-sections were analyzed using dual beam microscope (focus ion beam and scanning electron microscope, FIB/SEM) and atomic force microscope (AFM).
The crystalline properties of these nano-textured surfaces (NTSs) were then characterized using scanning electron microscope (SEM), energy dispersive X-ray spectroscopy (EDS), X-ray diffraction (XRD), transmission electron microscope (TEM), and atomic force microscope (AFM).
Nanotubes may also be used as highly resilient probe tips for scanning tunneling microscopes and atomic force microscopes.
Devices called scanning tunneling microscopes and atomic force microscopes have been used for more than 15 years to scrutinize the surfaces of materials.
