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Ministers want to amend legislation passed earlier this year to require firms to retain data, including that "required to identify the sender or recipient of a communication, the time or duration of a communication, the type, method or pattern of communication and the telecommunications system used".
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After normalization, multivariate statistical methods or pattern recognition methods are used to handle the acquired data, to search for the discriminating features and to identify the biomarkers from the tested samples.
The findings reveal the various methods or patterned ways in which the question-answering and answer-framing sub-activities are accomplished through the students' peer group talk-in-interaction.
We even re-examine the methods or habit patterns we use to achieve our objectives in these areas, such as friendly persuasion or intimidation.
3 Improving the understanding of missingness structure in a data set allows for consideration of other appropriate multiple imputation methods, or other methods to incorporate partially observed variables, such as random effect models, Bayesian methods, down-weighting analyses, or pattern mixture models.
Most waterflood management is restricted to classical methods (e.g., surveillance or pattern balancing) or sensitivity studies centered on finite difference simulation.
These properties are the basis of FIM, either for candidate generation or pattern growth methods, with horizontal or vertical data formats.
In addition, classification strategies using neuroimaging biomarkers are based on assessments of specific or composite regions of interest (ROI) or pattern analysis methods.
The method of Pattern Matching (PM) or Pattern Imitation [8] presented in this paper can be ascribed to local modeling; it avoids the assumptions normally required in the context of time-series modeling (e.g. stationarity and/or Gaussian condition) and is based on the imitation of the past patterns in the data history.
In order to determine the crystallographic directions (e.g., ⟨110⟩) on silicon wafer with high precision either cleaved-edge method or wet anisotropically pre-etched patterns are employed.
The classifier can be based on fixed threshold as in decision tree methods, or based on pattern recognition (PR) methods as in artificial neural networks (ANNs) and support vector machines (SVM) [7, 8].
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