Sentence examples for mechanism of defect formation from inspiring English sources

Experiments on electrical devices were performed to identify the defect source and determine the mechanism of defect formation, and integrated manufacturing processes implemented to eliminate defect issues are also investigated.

It is also inferred that the change of cooling medium does not significantly influence the mechanism of defect formation.

In this paper, numerical and theoretical analyses have been conducted to discuss the mechanisms of defect formation during the crystal growth.

Based on an understanding of defect formation mechanisms, the discussion in this chapter focuses on how each part of the profile can be engineered to minimize the defect rate and to maximize reliability.

This paper provides a review of defect formation mechanisms in SLM.

An atomistic understanding of the processes which control the quality of interface during growth is very important, and simulation is a suitable tool for understanding strain and stress effects during growth and description of defect formation mechanisms.

To distinguish between different models of defect formation and mechanisms of stress accommodation in Nd-containing manganites, a number of additional studies and calculations are necessary, but such activities go beyond the scope of this work.

Knowledge on the kinetics of defect formation may help to design stable membranes or serve for novel mechanism for controlled release.

In this study, the mechanisms of folding defect formation and avoidance in forging of axisymmetrical flanged parts are systematically studied via FEM simulation.

The simulated mechanisms include the kick-out diffusion mechanism, extended defect formation and the activation/deactivation of dopants through the formation of impurity clusters.

We analyze two kinds of formation mechanism of defect modes as the photonic band gap effect and total internal reflection effect, and find that defect-mode properties are influenced significantly by the stack sequences of the two semi-infinite background PCs relative to the defect layer.