Sentence examples for measured surface topography from inspiring English sources

The direction differences create interference patterns and the interference fringes are used to reconstruct the measured surface topography.

The measured surface topography was incorporated into a finite element model, which allowed simulating the indentation of an axisymmetric sample by a rigid spherical indenter.

In order to explain the high dependence of SN curves on the surface roughness of the specimen, an approach based on the finite element analysis of measured surface topography is proposed.

It ideally should be of small size and able to measure surface topography in nanometer scale.

The paper presents the issues concerning difficult-to-machine materials along with machining process and technologies used to measure surface topography.

Beyond being merely a tool for measuring surface topography, AFM has made significant contributions to various biomaterials research areas dealing with the structure, properties, dynamics and manipulation of biomaterials surfaces and interfaces.

The TPM is a force-controlled scanning probe which has two precision capacitive sensors, one to measure surface topography and the deformation being made under a required loading force and the other to measure the frictional force between the tip and the surface being scanned.

Using atomic force microscopy to measure the surface topography of chemically fixed Xenopus laevis oocyte nuclear envelopes, we present measurements of the relative position of the central granule within the NPC lumen under a variety of conditions known to modify nuclear Ca2+ stores.

Kelvin probe force microscopy (KPFM) [1] combined with noncontact atomic force microscopy (NC-AFM) has been developed and widely used in measuring surface potential distribution and topography at atomic-scale resolution on various conductive [2, 3], semiconductive [4], and insulative surfaces [5] and even on a single molecule [6].

Atomic force microscopy (AFM) is an effective tool to measure the surface topography of materials by "touching" the sample surface with a mechanical probe.

We present design and implementation details of the Diamond-NOM (nanometre optical metrology)—a non-contact profiler capable of measuring the surface topography of large (up to 1500 mm long) and heavy (up to 150 kg) optical assemblies with sub-nanometre resolution and repeatability.