Exact(60)
Open image in new window Fig. 9 Measured frequencies in the modeled system.
The resonant frequencies of graphene resonators predicted from our continuum elastic model (i.e., plate model) are consistent with experimentally measured frequencies of graphene resonators [15].
The experimentally measured frequencies of the buckling patterns were compared to the theoretical predictions and a reasonable agreement was found.
Both simulated and measured frequencies f follow the criterion L/uc+L/c0= n/f where L is the gap length between nozzle exit and end plate, uc is the shear layer convection velocity, c0 is the speed of sound, and n is a mode number (n= 12,1,32,…).
To address these hypotheses, we measured frequencies of activated (CD38+ HLA-DR+), regulatory (CD4+CD25+CD127dim), HIV-specific, and CMV-specific T cells in a large cohort of HIV controllers.
To address these hypotheses, we measured frequencies of activated (CD38+ HLA-DR+), regulatory (CD4+CD25+CD127dim), HIV-specific, and CMV-specific T cells among HIV controllers and 3 control populations: HIV-infected individuals with treatment-mediated viral suppression (ART-suppressed), untreated HIV-infected "non-controllers" with high levels of viremia, and HIV-uninfected individuals.
Since the measured frequencies are in good agreement with previous results, we believe that the bulk of our sequences represent bona fide 3'-processing sites.
Finally, the periodic EIP-sponsored FoodNet Population Surveys have measured frequencies of consumption of a variety of foods, including selected high-risk foods (e.g., alfalfa sprouts, unpasteurized milk).
In particular, assuming that mutation frequency can be modeled as a Poisson process will lead to inappropriate confidence in measured frequencies.
That is, if there are n measured frequencies, we pick n frequencies at random (with possible repetitions) and measure CP and CD, then reiterate many times to obtain a distribution, from which we extract the covariance matrix.
Dielectric constant and loss were measured at room temperature with measured frequencies of 1, 10, and 100 kHz using a 4284A LCR meter (Agilent Technologies Inc., Santa Clara, CA, USA). Figure 1 presents XRD patterns of Bi0.5Na0.5Zr1-xTixO3 ceramics where x = 0.3, 0.4, 0.5, and 0.6.
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