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The reciprocal of the characteristic frequency (1/ωmax) represents the mean electron lifetime [τeff].
The three fitted parameters of Rw, Rk, and Cμ can be used to calculate additional parameters, such as the mean electron lifetime (τeff), effective electron diffusion coefficient (Deff), and effective electron diffusion length (Leff), which are useful for evaluating cell performance.
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electron lifetime.
The silicon wafers were used for electron lifetime determination.
This results in a stronger electron transfer resistance and a shorter electron lifetime in the ZnO film [31].
The efficacy of this process is mainly determined by the diffusion coefficient of electrons (De) and the electron lifetime (τe).
The electron lifetime of DSSCs with ATN increased from 0.29 to 0.34 s and that electron recombination was reduced.
There is a very few experimental data regarding the electron lifetime in semimetal HgCdTe structures.
The laid ZNL cell shows a slightly better electron lifetime than the other ZNL cells.
The electron lifetime of DSSCs with ATN increased from 0.29 to 0.34 s.
Thus, the electron lifetime evaluated as τ = 1/2πωmax is accordingly increased after MPA treatment.
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