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The mean coating thickness of the ray-traced data from the numerical simulations agrees well with the mean coating thickness as determined by the off-line TPI measurements.
The mean coating thickness of in-line TPI measurements is slightly higher than that of the off-line measurements.
When the cap-to-band projected area ratio is larger (or smaller) than the cap-to-band surface area ratio, the mean coating thickness on the cap is larger (or smaller) than that on the band.
We demonstrate that the coating thickness variability as determined from the ray-traced data and the terahertz in-line measurements represents mainly the intra-tablet variability due to relatively uniform mean coating thickness across tablets.
This discrepancy can be corrected based on the cap-to-band surface area ratio of the tablet and the cap-to-band sampling ratio obtained from ray-tracing simulations: the corrected mean coating thickness of the in-line TPI measurements shows a better agreement with that of the off-line measurements.
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Table 2 UPF of polymer-encapsulated phthalocyanine green aluminum pigment coated cotton fabrics C.T. (mm a UPF UPF class Handle 0 8.66 No class Softest 0.02 85.56 Excellent Softer 0.04 161.21 Excellent Soft 0.06 220.38 Excellent Poor Thickness of cotton fabric 0.21 mm, Cotton fabric was used aC.T. means coating thickness.
The mean dissolution times were found to correlate with the average coating thickness measured over all surfaces.
A power law was found for the dependence of the mean column diameter on coating thickness in qualitative agreement with phenomenological models for thin film growth.
A power law was found for the dependance of the mean column diameter on coating thickness in qualitative agreement with phenomenological models for thin film growth.
Pressure loss and wall coating thickness measurements were made simultaneously at mean (bulk) water velocities of V = 0.5, 1.0, 1.5, and 2.0 m/s.
According to the manufacturer coating was completed including overall 9 layers (4 Ag layers, 5 SiO x C y layers; thickness of one complete layer Ag + SiO x C y : 30 50 nm) resulting in a mean Ag content of 8.1 µg/cm and a maximum coating thickness of up to 300 nm.
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