Sentence examples for maximum peak width from inspiring English sources
where, L is the average crystallite size, λ = 0.15418 nm for CuKα, β is the half maximum peak width and θ is the diffraction angle in degrees.
where L is the average crystallite size, λ = 1.5418Ǻ for CuKα, β is the half maximum peak width, and θ is the diffraction angle in degrees.
The parameters in XCMS were set as follows: centWave settings for feature detection (Δ m/ z = 15 ppm, minimum peak width = 10 s and maximum peak width = 120 s) and mzwid = 0.015, minfrac = 0.5, and bw = 5 for chromatogram alignment.
For XCMS processing of reversed-phase LC data, we used the same parameters except for chromatographic peak width settings, which was set as minimum peak width = 10 s and maximum peak width = 60 s.
Parameter settings for XCMS processing of our demonstration data acquired by HILIC were as follows: centWave for feature detection (Δ m/ z = 15 ppm, minimum peak width = 10 s, and maximum peak width = 120 s); obiwarp settings for retention-time correction (profStep = 1); and parameters for chromatogram alignment, including mzwid = 0.015, minfrac = 0.5, and bw = 5.
The mass spectrometer was operated in the positive mode at a spray voltage of 1500 V, a capillary temperature of 270°C, a half maximum peak width of 0.7 for Q1 and Q3, a collision gas pressure of 1.2 mTorr and a cycle time of 1.2 ms. The measurements were scheduled in windows of 4 min around the pre-determined retention time, with a maximum of 150 concurrent transitions.
SRM transitions were monitored with a mass window of 0.7 half-maximum peak width (unit resolution) in Q1 and Q3.
All transitions were monitored in scheduled mode with a retention time window of ±600 s, a cycle time of 2 s, and a mass window of 0.7 of half-maximum peak width (unit resolution) in Q1 and Q3.
The instrument was operated in scheduled SRM mode (retention time window of 300 s, target scan time of 3 s), at a unit resolution (0.7 m/z half-maximum peak width) of both Q1 and Q3 analyzers.
Additionally, the ratio of maximum peak shear crack width to residual maximum crack width, it can be increased by shortening stirrup spacing and increasing stirrup strength, and its overall average value is 2.44.
We also calculated occipital (O1 and O2) alpha mean frequency, alpha peak frequency at maximum amplitude, alpha peak width, and theta regional mean frequencies.
