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This non-subjective assay works well with FFPE material, as confirmed by comparison with results from assays of fresh-frozen samples.
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These may have arisen due to the poor carbonization of acetylene, leading to impurities such as amorphous carbon and hence the formation of a higher degree of non-graphitic carbonaceous materials, as confirmed by the laser Raman results (Figure 3a).
All previous changes in the potential plateau, number of plateaus and shape of charging discharging curves can be due to structural re-arrangement in the electrode materials as confirmed by CV curves in Fig. 3c and d.
The improved cell performance is attributed to the functional carbon-coating layer, which serves as an upper current collector to facilitate electron transport for high active-material utilization and a conductive network for trapping and depositing dissolved sulfur-containing active materials, as confirmed by scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS).
The improved cell performance is attributed to the porous architecture of the Al2O3-coating layer, which serves as an ion-conducting skeleton for trapping and depositing dissolved sulfur-containing active materials, as confirmed by scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS).
Adhesive wear also contributed to the material loss as confirmed by EDS analysis that revealed a transfer of the coating material to the counterpart.
It was observed that the structural integrity of the parent OMC material remained intact as confirmed by the TEM analyses.
As shown in Figure 2b, Ti-KIT-6 (200) shows a uniform Ti dispersion with hardly any Ti agglomeration, which indicates the preserved structure of the support material, as is confirmed by the mesoporous channels of KIT-6.
The model is successful in providing accurate description of device operation for wide range of structural, material and dimensional parameters as confirmed by the close agreement with experimental data from different devices and can be used for optimizing device performances before fabrication.
These materials have α-NaFeO2 (R¯3m) structure, as confirmed by X-ray diffraction (XRD) studies.
Significant results (table 1 and supplementary table S6, Supplementary Material online) were found for hcARSs compiled for this work as well as confirmed ARSs in OriDB (Nieduszynski et al. 2007) (see supplementary table S2 [ Supplementary Material online] and Methods).
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