Sentence examples for mass spectroscopy profiles from inspiring English sources

This method requires comparison of mass spectroscopy profiles against a database of isolates belonging to known species.

BD used in the present experiments was isolated from the fruit of Brucea javanica L. and its identity was confirmed by comparing its nuclear magnetic resonance and mass spectroscopy profiles with the published data (Yang et al, 1996), whereas its purity was calculated to be over 95% based on HPLC analysis (data not shown).

Diffusion of Au into Cu thin films of varying grain size is measured using secondary ion mass spectroscopy depth profiles.

Secondary ion mass spectroscopy (SIMS) profiles have shown a good homogeneity of the layers and no interdiffusion of the different species into the substrate.

In a search for an alternative or additional serum markers for HCC, we and others (Poon et al, 2003; Schwegler et al, 2005; Ward et al, 2006b) have used surface-enhanced laser desorption/ionisation (SELDI) mass spectroscopy to profile the serum proteomes of patients with HCC and chronic liver disease and those with chronic liver disease alone with a view to identify a specific HCC signature.

A key application of clustering data obtained from sources such as microarrays, protein mass spectroscopy and phylogenetic profiles, is the detection of functionally related genes.

Two approaches were used: a) mass spectroscopy-based profiling for 159 point ('hot-spot') mutations in 33 genes commonly involved in solid tumors and b) next-generation sequencing (NGS) platform that examined the complete coding sequence of in 182 cancer-related genes.

The SiC/Si interface is clearly shown in secondary ion mass spectroscopy (SIMS) depth profile as judged by the sharp decrease 13C signals.

Secondary ion mass spectroscopy (SIMS) depth profile analysis on the as-implanted wafers showed that there are two hydrogen enrichment peaks around both sides of the projected range Rp of oxygen, which correspond to the two interfaces of the BOX layer of the annealed samples.

Depending on the method implemented, the secondary ion mass spectroscopy (SIMS) depth profile showed relatively smooth or step-like changes in the elemental concentration of B, C and N. The primary analysis on the chemical bond of the graded interlayer was conducted by measuring the chemical shift of B1s, C1s and N1s spectra by X-ray photoelectron spectrometry (XPS).

Furthermore, time-of-flight secondary ion mass spectroscopy (TOF-SIMS) depth profiles in Additional file 1: Figure S2 show that Mo decreased after annealing at 400°C in N2, which correlated with the XPS data.