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Exact(20)
The film with N = 1 shows the lowest surface roughness with its rms roughness value to be 0.59 nm.
The lowest surface roughness (Ra = 0.332 nm) were obtained at Λ of 20 nm.
Lowest surface roughness and MRR of 0.001208 mg/min was obtained.
It also showed the lowest surface roughness and highest water contact angle among all unirradiated and irradiated POM-C blocks.
The investigation of the influence of process parameters showed, that the lowest surface roughness was achieved without lubrication.
A lowest surface roughness of 4.62 nm for 50 kHz pulsing frequency is seen in atomic force microscopy measurements.
Similar(40)
Low surface roughness and contact angle favoured the antifouling nature.
However, CLSM requires that the samples under detection be with low surface roughness.
TIRM requires the sample with a low surface roughness and transparency to the incident light [40].
The low surface roughness can be explained by the slow growing rate of film.
The low surface roughness can be attributed to the slow growing rate of the film.
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