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(b) XPS O 1s plasmon loss spectra of ZrO2 and IL for 15-min sample.

Figure 1 Electron energy loss spectra (a) and energy loss (b) and amplitude (c) maps.

Similarly, analysis of electron energy loss spectra (EELS) also implies positivity on all factors and abundances.

Common techniques need energy loss spectra with high statistics to estimate ion abundances.

Experimental loss spectra have been reproduced by means of a hydrodynamic model.

b O 1 s electron energy loss spectra of SiO2/Si, TiAlO/SiO2/Si, and Al2O3/SiO2/Si structure.

Fig. 3 Electron energy-loss spectra extracted from the EFTEM series.

A high-speed DualEELS mode simultaneously acquires core- and low-loss spectra up to 2 keV apart.

For energies <50 keV, the measured energy-<span class="lh lhl">loss spectra show symmetric photopeaks, becoming increasing tailed at higher energies due to hole trapping.

EELS studies of carbon core-loss spectra show that the relative sp2 content in these carbons varies between 83% and 98%.

Transmission electron microscopy analyses were performed and dual electron energy-loss spectra were acquired in different regions of GO and reduced GO flakes.