Typical fault effects include functional changes, propagation delay increases, sequential logic faults, stuck-at faults, reduced noise margins, and increased IDDQ.
One, test data that kills all mutants generated by current mutation tools can still miss detection of some common logic faults because such tools lack appropriate logic mutation operators.
The logic identifying fault is described as below: if the logic values of fault direction detected on both sides of HVDC line are equal to 1, an internal fault will be determined; if the logic value of fault direction on one side is 1, while that on the other side is −1, an external fault will be discriminated; otherwise, it is normal.
The detection module analyse the alerts generated by each VM using the Dempster-Shaferther theory (quantitative solution classifier) in 3-valued logic and fault tree analysis (FTA).
The results are presented in the form of confusion matrix which shows the classification capability of wavelet features with rough set and fuzzy logic for fault diagnosis of monoblock centrifugal pump.
Microsoft lawyers argued that the commission's very logic was at fault; that computer users routinely used more than one media player and that bundling applications in one product was not in itself an abuse of market dominance.
Therefore, the application based on fuzzy logic theory in fault diagnostics is closer to human thinking habits and language expression.
Using these two indices as a combined supervisory logic, three-phase fault in the third zone can be rapidly and reliably detected and discriminated from system stressed conditions, and thus avoid false operation of distance relay during stressed system conditions.
In designing fuzzy logic systems for fault diagnosis, problems can be encountered in the choice of symptoms to use fuzzy operators and an inability to convey the reliability of the diagnosis using just one degree of membership for the conclusion.
However, many of the fault-based attacks used in cryptanalysis produce faults that can be modeled as bit-flip in memory elements or transient pulses in combinational logic, as in faults due to radiation effects.
