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In this study, Ti-6Al-4V fabyicatwo by two AM techniques: Laser Engineered Net Shaping (LENS) and Electron Beam Melting (EBM) were investigated and critically compared.
In this study, structural materials fabricated by two AM techniques were investigated: Laser Engineered Net Shaping (LENS) and Electron Beam Melting (EBM).
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Nevertheless, our simulations capture the appearance of a central bright spot at t = 20 min which reflects the crater acting as an electron lens and focussing the electrons to a caustic (Fig. 7).
Scanning electron microscope (SEM) examinations were performed by a LEO 1530 (Carl Zeiss AG, Oberkochen, Germany) microscope using in-lens and backscattered electron modes.
In situ TEM experiments were realized on a JEOL ARM 200F microscope equipped together with a CEOS aberration corrector for the objective lens and a cold FEG electron source [20, 21].
Reflected light was collected by the lens and focused to the compact Electron Multiplying CCD (EMCCD) camera (Luca, Andor Tech).. Cross-polarizers in front of the projector and camera rejected specularly reflected light, while a 650 nm long-pass fluorescence filter was used for imaging PpIX fluorescence and an OD filter for reflectance imaging.
Figure 3 Density of states for trion and electron in vertically coupled lens-shaped QDs.
However, since the inside of the tube is narrow and long, the electron emitter should be also miniaturized, and additional use of an electrostatic or magnetic lens for electron beam focusing is limited.
These cells, as well as cells expressing cytosolic or plasma membrane-targeted CaNAR2, were imaged on a Nikon Eclipse Ti inverted fluorescence microscope (Nikon Instruments, Melville, NY) equipped with a perfect focus system (Nikon), a 100x/1.49 NA oil-immersion objective lens, an electron multiplying charge coupled device camera (Photometrics, Tucson, AZ), and a laser TIRF system (Nikon).
A Leo 1525 with Gemini column fitted with a field emission gun at 5 kV, working distance between 5 10 mm, with a 30 μm aperture and In-lens secondary electron detector (SEI) was used.
Utilizing an additional magnetic lens between the electron acceleration and the nominal condenser lens system, a larger percentage of the electrons created at the cathode are delivered to the specimen without degrading temporal, spatial and energy resolution significantly, while at the same time maintaining the femtosecond temporal resolution.
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