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The analytical conditions were: 1 kV accelerating voltage.
For magnifications of 3000 times or less, a 5 kV accelerating voltage was used, but at higher magnifications, a 10 kV accelerating voltage was employed.
Operating conditions of 20 kV accelerating voltage, and 20 nA probe current were used for analysis.
TEM was performed with a JEOL-JEM-1011 JEOL-JEM-1011 JEOL-JEM-101100 kV accelectrong voltage.
The samples were scanned under a scanning electron microscope (Hitachi S3000N) at 15 kV accelerating voltage.
The backscattered electron (BE) images were photographed under 15 kV accelerating voltage.
Images of the film were taken at 20 kV accelerating voltage at different magnifications.
SEM images were recorded with 25 kV accelerating voltage at 35× to 1000× magnification.
Transmission electron microscopy (TEM) analysis was performed using Cambridge, stereo scan 360, 1990, 100 kV accelerating voltage.
Similar(2)
Whole amounts were examined using Hitachi S4800 (Hitachi, Japan) operating at a 10-kV accelerating voltage.
Images were acquired at 5-kV accelerating voltage and 30-μm wide aperture.
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