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To control the lateral density of NW and NT arrays, since it can influence device performance, is one of the most important challenges.
They are particularly crucial in electronics thermal management since excessive junction-to-ambient thermal resistances can cause elevated temperatures which can negatively influence device performance and reliability.
We also provide insights into the factors that influence device efficiency and stability, and provide guidelines for future fabrication strategies for more advanced devices.
Thus material quality, the specific epitaxial design as well as the device topology will directly influence device performance, reliability and mode of degradation.
Participants explored how to involve patients throughout the life cycle of a medical device, including discussions of how patients can influence device design, assist in the planning and implementation of clinical trials, and provide input to affect regulatory decisions.
It is of great importance for numerous MEMS applications to have a precise knowledge of the thermal properties as they can influence device's final performance.
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Polisena et al. conducted a systematic review on factors that influence device-related incident recognition, reporting and resolution of device-related incidents, as well as interventions or strategies to improve the recognition, reporting and resolution of device-related incidents.
Our study objectives were to i) explore factors that influence device-related incident recognition, reporting and resolution and ii) describe barriers and existing and/or recommended initiatives to improve the recognition, reporting and resolution of device-related incidents with a particular focus on potential roles of physicians and nurses.
And, the nonuniformity of film thickness at 8000 rpm may be especially important on influencing device efficiency.
The surface work function of transparent conducting oxides is a critical parameter influencing device efficiency by controlling charge transport across interfaces.
In here, a double diode model is used that allows a more realistic account for the carrier recombination in the absorber layer, which strongly influences device characteristics under low illumination intensity [20], particularly prevalent in the case of thin film materials [21].
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