Three types of material distribution are considered to investigate the effects of gradient index, thickness ratio of ceramic, material ratio, and width-to-height ratio on the various rigidities of cross-section of FGM sandwich box beams.
Numerical results are compared with earlier works and investigated effects of the power-law index, thickness ratio of layers, span-to-depth ratio and boundary conditions on the critical buckling loads and natural frequencies.
Through numerical examples, two types of material distributions are considered to investigate the effects of shear deformation, gradient index, thickness ratio of ceramic, boundary conditions, and span-to-height ratio on the dynamic responses of FGM bisymmetric and mono-symmetric I-beams.
Especially, the effects of various structural parameters of thin-walled FG sandwich beams such as gradient index, thickness ratios of ceramic in flanges and webs, and non-symmetricity of cross-section on the warping to torsion ratio of cross-section and the spatially coupled natural frequencies are parametrically investigated.
Using coupling mode theory and transfer matrix method, the influences of refractive index, thickness and length of the coating layer on the spectral characteristics of the new type LPFG were analyzed.
Refractive index, thickness and porosity of untreated and treated coatings were deduced from ellipsometry measurements.
We investigated quantitative changes over time in ultrasound signal intensity (an index of stiffness), signal duration (an index of surface irregularity), and interval between signals (an index of thickness) of plug cartilage in an animal model of autologous osteochondral grafting.
The refractive index and thickness of the samples were measured using an ellipsometer with refractive index estimated to be 1.61 and thicknesses values being 0.91 μm, 1.36 μm, 3.37 μm and 4.40 μm.
where n is the refractive index; d, thickness of epilayer; m, even number; and λ, incident light wavelength.
The refractive index and thickness of the films were measured by ellipsometry method.
