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AFM was used in contact mode.
In contact mode, this limitation is absent.
The system allows topography measurements in contact mode.
The scans were carried out in contact mode.
Figure 3 Wear of diamond substrates in contact mode AFM.
The surface morphology of the specimens was probed in "Contact Mode".
Therefore, we analyzed the nanostructures of beta cells and IPCs through AFM in contact mode.
Figure 7 AFM images in contact mode of a MCF-7 cultured on pSi.
Figure 5 AFM images in contact mode of a DPSC cultured on pSi.
They can be simultaneously recorded in c-AFM configuration operating in contact mode.
The morphology of the device surface was measured by atomic force microscopy (AFM) in contact mode.
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