Fundamentally, the limited range of activities of participatory (futures) research must be assessed realistically: In addition to the essential reflection on the strengths and weaknesses of the case-specific and variable-configurative research design, it is important to consider in case of participatory research that this research approach is suitable exclusively for small and manageable fields.
Recently, Abdu et al. ([2012]) discussed the mechanisms of radio wave echoes due to ESF irregularities and concluded that a significant portion arises out of coherent backscattering perpendicular to the magnetic field lines in addition to the total reflections.
In addition to the characteristic reflections from CNTs and PANI, all of the diffraction peaks unaccounted for by the characteristic of the CNTs and PANI could be indexed to the cubic crystal structure of BaTiO3, which matched well with the reported data (JCPDS No. 31 0174); no meaningful change was observed before and after the PANI polymerization.
In addition to the GaAs(111) reflection, a weak peak can be observed in the smaller omega-2theta side of the GaAs(111) reflection in the spectra of samples NW2 and NW3 (Fig. 6a).
The 3D scene, or the simulation environment, can be defined using any CAD software in which the user specifies, in addition to the setting geometry, the reflection characteristics of the surface materials as well as the structures of the emitters and receivers involved in the simulation.
In addition to the coherent interaction mechanisms (reflection, transmission, diffraction) modeled by geometrical optic and uniform theory of diffraction, diffuse scattering is also considered through the effective roughness (ER) approach [11].
All 'heads-free' eyetrackers need to track the position of the head in 3-D space (in addition to the pupil and corneal reflection) in order to estimate where a participant is looking (see Fig. 2); this information is always automatically stored in every recording session.
In addition to the effect of the wave reflection, the nonlinear dissipation of the Alfvén waves also plays a role in the sensitive dependence on the input wave energy (SI06).
After deposition of Ag on NiO films at various deposition times, in addition to the NiO (200) peak, (111) reflection of silver (JCPDS card No. 87-0720) can be observed in all the films.
