Chen, S. et al. High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopy.
The goal is to generate high-resolution noise source maps with self-consistency, i.e., their integration over the extent of the noise source region gives the far-field pressure auto-spectrum for a particular emission direction.
FSC curves were calculated from data half-sets using soft masks and corrected for the effect of the mask using high-resolution noise substitution.
All reported resolutions are based on the gold-standard FSC = 0.143 criteria (Scheres and Chen, 2012), and the final FSC curve were corrected for the effect of a soft mask using high-resolution noise substitution (Chen et al., 2013).
High-resolution noise will be uncorrelated between the two maps.
Fourier Shell Coefficient (FSC) curves were corrected for the effects of a soft mask on the FSC curve using high-resolution noise substitution (Chen et al., 2013).
After identifying cone locations, the high-resolution noise stimulus was integrated against the Gaussian profile of each cone, to obtain a set of cone input signals for each RGC.
All resolutions were based on the gold-standard FSC = 0.143 criterion (Scheres and Chen, 2012), and FSC curves were corrected for the effects of soft masking by high-resolution noise substitution (Chen et al., 2013).
Reported resolutions are based on the gold-standard FSC = 0.143 criterion (Chen et al., 2013) and were corrected for the effects of a soft mask on the FSC curve using high-resolution noise substitution (Chen et al., 2013).
Reported resolutions are based on the gold-standard FSC = 0.143 criterion (Scheres and Chen, 2012) and Fourier shell correction curves were corrected for the effects of soft masking by high-resolution noise substitution (Chen et al., 2013).
