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Image simulations have been performed to show that APBs can only be seen under specific defocus conditions in high resolution lattice images.
The extensive use of transmission electron microscopy (mainly electron diffraction and high resolution lattice fringe imaging) enabled further understanding of graphite growth mechanisms.
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High-resolution lattice images obtained from such features have revealed that the "faults" are actually embryonic γ lamellae, just a few atomic layers in thickness, which clearly exhibit the ordered L10 structure.
High-resolution lattice imaging, electron diffraction, energy dispersion X-ray analysis and energy filtering electron microscopy are all utilized to get insights into the structure, chemistry and stability of tip-end cone-like nanoparticle- or nanowire-like fillings.
d High-resolution lattice image showing SrGe2 crystals.
Figure 5b is the high-resolution lattice image.
Figure 5 shows the high-resolution lattice image of the 5 10-nm multilayer film annealed at 1,273 K.
Figure 5 High-resolution lattice image of Al 2 O 3 /ZrO 2 (5:10 nm) multilayer film annealed at 1,273 K in HTXRD.
The inset of (b) shows the high-resolution lattice image of the corresponding NW. Figure 2a shows the UV-Vis specular reflection spectra of the as-grown and RTA-treated ZnO NWs.
The inset shows the high-resolution lattice fringe image of the selected area of the ZnO NWs. Figure 1c shows the SAED pattern of one of the ZnO NW.
The transmission electron micrograph (TEM), energy dispersive X-ray (EDX) spectroscopy, and high-resolution lattice image were analyzed by a high-resolution field emission transmission electron microscopy (HRTEM, JEOL Model JEM-2100F).
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