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We also demonstrate importance of such an approach by directly comparing high resolution depth profiles measured on clean areas versus arbitrarily selected areas.
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Optical coherence tomography (OCT) [ 1] is a non invasive imaging technique that has the potential to provide fast and high resolution depth-resolved information of the scattering properties of biological samples.
In ophthalmology, OCT has become an indispensable tool for diagnosis of disease and monitoring therapy due to its ability to perform high resolution depth-resolved cross-sectional imaging of retinal structures [ 10].
Combining geologic maps, high-resolution depth and gravity readings, and historical patterns of earthquakes in the region, the authors argue that this sudden halt was due to a geologic discontinuity in the plate, where Japan's oldest rocks (to the north) are juxtaposed against more recent, mainly volcanic rocks.
The main idea here is to avoid the disparity map stage because it requires extremely computationally intensive operations and cannot suitably estimate the high-resolution depth maps in the video sequence applications.
The SACS permitted a high-resolution depth profiling to distinguish between the different layers used in this concept and to measure their different mechanical properties like hardness and elastic modulus as well as interface widths and revealed a maximum hardness of 59 GPa and an elastic modulus of 463 GPa of the thick c-BN O top layer.
Its rationale is to interpolate and smooth a depth map, while preserving the edge information, by computing a weighted average for each pixel (x, y) in the high-resolution depth image d H. Within a local window Ω x,y) centered at (x, y), each pixel (x′, y′) is associated with a weight which is a function of the Euclidean distance and color difference with respect to the central one.
The OCT, in contrast, provides a high-resolution depth profile based on reflectivity that correlates well with histomorphological sections (Fig. 1C).
In vivo cross-sectional imaging was performed using a commercially available third generation Spectralis HRA+OCT (Heidelberg Engineering, Heidelberg, Germany), which provides high-resolution depth profiles of the retina based on reflectivity of light.
XPS analysis was based on several high-resolution depth profiles.
Here we describe a method that combines CNV detection through high-resolution depth of coverage analysis with call confirmation through partially-mapped reads.
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