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(d) The topographic height profile along green line.
(c) The topographic height profile along deep-blue line.
The inset shows the step height profile of MoS2 in the AFM image.
The height profile (cyan-blue line) was obtained along the cyan-blue line.
(d) Black line graph: height profile from b. Red line graph: potential section from c.
(d) Tapping-mode AFM images representing 2D mapping and height profile.
The height profile along the shrunk outline was used to calculate the value of SDCH.
If greater than zero, raytracing is done from the actual photosphere, otherwise the spectrum is raytraced from the equatorial plane ignoring the height profile of the disk.
Solid black line: experimental height profile section from a. Solid red line: experimental potential section from b. Dashed black line: section of the model system shown in c.
In the experimental height profile, we find that the size of the void is smeared out laterally, which we attribute to the finite radius of the tunnelling tip.
Such stochastic PDEs arise naturally in the modeling of surface height profile evolution in thin film growth and sputtering processes.
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