The transition velocity (and radius at which this occurs) in the Liu et al. (2015) profiles are given as dotted lines.
The total strain rate as a sum of elastic, plastic and thermal strain rate was given as, {dot{varepsilon}}_{total}={dot{varepsilon}}_{elastic}+{dot{varepsilon}}_{plastic}+{dot{varepsilon}}_{thermal} (6).
The results of cultivation in medium B are given as black dots.
Next, the similarity between two LCs, LC a and LC b, is given as a normalized dot product of the two property vectors Sim LC a, LC b ) = PV LC a )· PV LC b )/| PV LC a )|| PV LC b )|.
(Note that, in our implementation, a property term to be used for labeling LC l is the term t h which is w(t h )Prop(t h, LC l ) ≥ w(t j )Prop(t j, LC l ), ∀ j, 1 ≤ j ≤ | Tall|.) Next, the similarity between two LCs, LC a and LC b, is given as a normalized dot product of the two property vectors; that is, Sim LC a, LC b ) = PV LC a )· PV LC b )/ PV LC a )|| PV LCC b )|.
Relative peak density values from dot blot analyses are given as average values from three independent experiments, with standard deviations.
The mean values of pixel intensity were calculated from each profile and presented as single dots and the arithmetic means are given as horizontal lines (C).
Square brackets with three dots indicate omitted text and if the quotation needs clarification it is given as text within the square brackets.
The adaptation law can be given as dot{hat{Xi}}=sum_{k=1}^{n} biggl(frac{gamma}{2}zeta^{2}_{k}biggr)vartheta _{k}^{T}bigl underline{e}_{k}(t bigr) vartheta_{k}bigl underline{e}_{k}(t bigr -sigma _{0}hat bigr -sigmahere γ and (sigma_{0}hat{Xi}esign positive constants.
