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The generation of test pairs is described in the next subsection.
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In this paper, a novel architecture for the generation of SIC pairs is presented.
Synaptic connectivity was tested for by the repeated generation of a pair of APs (evoked by 2 ms test pulses; 0.5 5 nA; separated by 50 ms; delivered at 0.33 Hz).
However, the temperature annealing can lead to the generation of electron-hole pairs in SiO2.
The generation of electron-hole pairs is detrimental to this photocatalytic efficiency of the photocatalyst.
One of the most popular excitation methods for modal testing of rotating machinery is known to be the uncorrelated isotropic excitation, which requires two independent random sources with equal power for generation of a pair of uncorrelated excitation signals.
Consistent with experimental findings the CFD simulations showed the generation of a pair of vortices.
The generation of gear pair is investigated based on two mismatched rack cutters.
Analysis of results involved Mann-Whitney test, paired difference test (Wilcoxon rank test), and Friedman tests.
For comparison of unpaired or paired, parametric or nonparametric groups, the Student t test, paired t test, Mann-Whitney test, and Wilcoxon matched pairs test were used, respectively.
Make a test pair first.
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