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In general, both the 2NN and the FIT approaches significantly reduced the 1NN predicted errors of all the OPs for both thicknesses.
With the TAR values as reference, Table 1 > quantitatively summarizes the absolute and percentage mean errors of 1NN, 2NN and FIT approaches.
It is well known that as the spread of the data increases, the slope of a least-squares fit approaches zero.
As an example, Fig. 4 shows the bottom layer OPs for D = 0.22 mm based on the 2NN and FIT approaches when 5% noise was added to the reflectance.
Similar(56)
The OPs after fitting were called results from the "FIT" approach.
The verification principle adopted is the curve fitting/Goodness of fit approach.
A global fit approach has been employed to obtain the spectral characteristics of the sources.
An additional advantage of the wavenumber fit approach is that it allows the accuracy of the fit to be determined.
By good luck, the overall model fit approached 100%.
However, such a "best fit" approach would benefit from further testing and refinement.
Alternatively, a curve fit approach could recognize the relationship between SD and mean by a regression line (curve fit).
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