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In Figures 12 and 13, electrical field and field intensity of the second neighboring site on each corner of the defect site are compared with those of the two mentioned first neighboring sites.
Analyses of the data of the sham group revealed no changes between the sessions for mislocalization rates to the first neighboring finger (p ≥ 0.822), the second neighbor (p ≥ 0.403), the third neighbor (p ≥ 0.730), and forth neighbor (p ≥ 0.709).
Open image in new window Figure 6 The ratio of field intensity for the first neighboring site of right/left side of defect site.
The post-edge features are due to multiple scattering of the excited electrons across neighboring atoms, sometimes extending beyond the first neighboring shell of the bonds.
In the AOMDV protocol, the intermediate node establishes a reverse path by selecting the first neighboring node from the route_list field of the routing table (see Figure 1).
As it is evident in Figure 12, these sites have different electrical field with opposite sign with the first neighboring site in the x direction (no. 1 or 3 sites) but with equality sign for lower frequencies and opposite sign for higher frequencies with the first neighboring site in the y direction (no. 2 or 4 sites).
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To achieve an overview of individual mislocalization behavior, the mislocalizations from each finger to any other finger were categorized as mislocalizations from the stimulated finger to the first-, second-, third-, or fourth neighboring finger leading to a total of eight first-, six second-, four third-, and two fourth neighbor fingers.
Finally, the same procedure is plotted for the second neighboring site on the corners of the defect site and is compared with the previously mentioned first neighboring site.
The similarities and differences of the sign and amount of the electric field at three sites are compared: the first neighboring site of the right or left (yellow line), the first neighboring site on upside or downside of the defect (green line), and the second neighboring site on each corner side of the defect (dark blue line).
The ratio of electric field intensity of the first neighboring site of the right or left (yellow line), the first neighboring site on upside or downside of the defect (green line), and the second neighboring site on each corner side of the defect (dark blue line) is compared.
It came out that minor In additions introduce low energy states with s character that present antibonding features with the Ti first neighboring atoms as well as with the Ti-Nb second neighboring atoms thus weakening the chemical bonds and leading to elastic softening.
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Justyna Jupowicz-Kozak
CEO of Professional Science Editing for Scientists @ prosciediting.com