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Atomic force microscopy was utilized to investigate film surface morphology and roughness.
The adhesion and detachment of the cell was found to be mainly dependent on the film surface morphology.
The SiC film surface morphology has columnar shape according to STEM images.
We have tried to improve the ramp-surface morphology by modifying the film surface morphology (base-YBCO electrode and LSAT isolation layer) and the ion etching conditions.
Also, the film surface morphology does not directly affect the structural properties of the prepared ITO thin films.
Drug loading and release have been characterized by optical spectroscopy for different peptide designs at different pH values, and film surface morphology has been characterized by atomic force microscopy (AFM).
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Significant changes in the film surface morphologies due to the plasma implantation treatment were observed.
We show how differing degrees of self-shadowing strongly modify film surface morphologies and compare these results with experimental findings.
a c AFM images of the ZnO film surface morphologies (5 μm).
(a - e) a - emAFMs of the ZnO fimagesrface mofphologies in 5μm; (f)-(j) magnified images of the square areas (marked by dashed black lines) in (a)-(e).
Results obtained from SEM analysis show that the energy of the ions plays an important role on the film surface morphologies.
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