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The film structures were characterized by X-ray diffractometer (XRD).
Chemical composition and film structures were investigated by Fourier transform infrared spectroscopy and X-ray diffraction.
A range of film structures were obtained by changing the nitrogen mass flow rate during deposition, and the film structures were determined using electron energy-loss spectroscopy.
The pentacene film structures were found to significantly affect the performances of pentacene field-effect transistors (FETs).
The film structures were analyzed by both reflection high-energy electron diffraction (RHEED) and transmission electron microscopy (TEM).
Magnetoresistive Fe Co based thin film structures were produced using thermionic vacuum arc method.
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Layered film structures are widely applied in industry.
The film structures are evaluated by X-ray photoelectron spectroscopy, glancing angle X-ray diffraction, and Raman spectroscopy.
However, in the case of the growth of SiC on graphene, the grain-like film structures are continuous without any cracking structure.
This is especially true in microelectronic applications where very small lateral as well as depth dimensions of device features and film structures are involved.
In principle, as the size of piezoelectric film structures is reduced to the nanoscale, the conversion efficiency can be improved dramatically due to nanomaterial's relatively large tolerance of deformations prior to failure [14].
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