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For each size scenario we analyzed the fault coverage.
The achieved fault coverage is 100% in the case of odd erroneous bits.
The experiments showed promising results in reducing the cost of testing and achieving high fault coverage.
The experimental results show the fault coverage and SEU occurrence causing faulty behavior of verified architectures.
Test output compactors can effectively reduce the data volume of test responses without scarifying fault coverage.
This scheme uses both frequency and time domain measurements in order to maximize the fault coverage.
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This paper proposes a method improving the fault-coverage capabilities of (FPGA) designs.
BIST is also likely to cause problems if its low-fault-coverage problem is not soon solved.
Further, the 100% fault-coverage by stuck-fault is framed in R-CQCA, which can be useful for a tester to maintain data-integrity.
Each area has the specific failure probability and fault detection coverage.
The use of Triple Modular Redundancy (TMR) with majority voters can guarantee 100% single fault masking coverage for a given circuit against transient faults.
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