Sentence examples for extract the stress from inspiring English sources

Moreover, the incompatible interaction integral method has been employed to extract the stress intensity factor components.

Dynamics simulations provide the contact forces for the finite element analysis, which the authors needed to extract the stress amplitude and the stress cycles for different values of stiffness and damping.

Firstly, stochastic load models are developed based on the long-term field measurements for realistic modeling of the truck load and the correlated wind and wave load, which serve as the input for the VBWW system to extract the stress time histories at critical structural details using multi-scale finite-element analysis (FEA).

For this, we map the areas around nickel precipitates, which are close to the wafer surface with μRS and extract the stress and the hole density.

Discrete atomic information, obtained from molecular dynamics simulation of crack propagation along GBs in polycrystalline solids, is incorporated with asymptotic singular fields near an interfacial crack tip between dissimilar materials in the atomic-level J-based mutual integral, to extract the individual stress intensity factors of modes I and II.

Stress interpolation curves illustrated the effect of contact to stress concentration on S-surface by extracting the surface stress data.

The 24 h urine samples were collected and analyzed for VMA and ascorbic acid for seven consecutive days to study the influence of the extract on the stress induced biochemical changes.

Numerical procedures for both solid models and shell or plate element models are presented to demonstrate the mesh-size insensitivity in extracting the structural stress parameter.

And then, we extract the peak maximum principle stress (PMPS) of the maximum principle stress time-history, setting as the numerator, and extract the maximum principle stress of the same zone after static excavation, and setting as the denominator.

We then measure area strain as a function of applied stress to extract the bending modulus of the lipid bilayer in the low-tension regime.

Application of the forward gated-diode recombination generation (R G) current method in extracting the F N stress-induced interface traps in SOI NMOSFET devices has been demonstrated in this letter.