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The country's national system of innovation (NSI) for IC design was investigated, which suggested that four major elements of NSI government policy, human capital, industry clusters, and bridging institutions explain the extensive diffusion of new technologies within the industry.
Recent works pointed out the extensive diffusion of these phenomena in plants and their importance in gene expression and stress response [ 11- 14].
Similar to transduced gliomas created with another glioma cell line (CNS-1) [ 16, 17], the transduced U251/brevican-shDNA mock transfected cell-derived gliomas were invasive and exhibited cell clusters that detached from the tumor core, as well as extensive diffusion of single cells within the brain parenchyma.
The number of studies which try to describe alternative splicing events in plants are still scarce, however many recent studies point to an extensive diffusion of the phenomenon and to its important role in modulating gene expression and stress response ([ 46- 48]).
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Observation may be indicated until symptomatic graft edema is accompanied by extensive diffusion.
Broad intermixing between the Ti and Pd layers and an extensive inter-diffusion of Si and Ti within the film substrate interlayer have been observed as evidenced by energy-filtered TEM and XPS argon ion sputter depth profiling.
Energy-filtered TEM (EFTEM) mapping of cross-section images and argon ion sputter depth profiling XPS analysis revealed both a broad intermixing between the Ti and Pd layers and an extensive inter-diffusion of Si from the substrate into the film bulk area.
However, we did not observe any extensive inter-diffusion of Si through the entire set of TiD y –Pd layers.
Both EFTEM images and XPS sputter profiles provided evidence for an extensive inter-diffusion of Ti, Pd, and Si.
We observe very extensive inter-diffusion of Ti through the Pd layer and segregation towards the top Pd surface, as well as interaction of Ti with interdiffusing Si from the substrate material.
The results of our most recent studies related to ultrathin TiD y /Pd films evaporated on quartz showed a progressive change in chemical composition within the surface and subsurface area of the film during annealing, leading to extensive inter-diffusion of Ti within the Pd top layer, strongly affecting the kinetics of deuterium desorption [ 7].
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