Sentence examples for expected via from inspiring English sources
The chief justice did write the decision for the majority, and he came down on the opposite side from what most everyone expected, via an argument no one expected.
On the one hand, this is much weaker than the UK government had expected (via the independent Office for Budget Responsibility) Duncan Weldon (@DuncanWeldon) In June 2010 the OBR assumed 2012 would be a year of booming recovery (+2.8%).
The results also suggest that further improved material quality and device performance can be expected via optimization of growth parameters.
Heartwood ring number was almost uncorrelated with the other key traits, density and stiffness, meaning that zero or slight negative gain would be expected via indirect selection.
The second possibility can be expected via changing the sign of the corresponding (beta _m) and simultaneously setting (gamma _m=0).
The savings from eco-driving were also compared to fuel and emissions reductions expected via the conversion of the transit fleets to compressed natural gas (CNG), another popular fuel conservation strategy.
Travel brands are already using virtual reality to good effect – Thomas Cook had great success selling special excursions to people who had booked holidays in New York by letting them get a flavour of what to expect via virtual-reality headsets, allowing them to virtually visit before they book.
When he put his project into motion 12 years later, it wasn't, as you might expect, via a nonprofit organization or a startup social enterprise.
He is seeking spousal support from Tutera's alleged $1-million 1-millionlannuald isalary demandisg full custody of the twins, whom they alsoexpecting via surrogate this summer.
Vancouver, Canada-based retailer Aritzia, which plans to open a 10,000-square-foot flagship at Westfield Century City in the spring, is giving potential customers a tiny taste of what to expect via a pop-up showroom at 8100 Melrose Ave.
Simulations show that no yielding is expected in vias embedded in SiCOH, which is also in agreement with experiment [D. Edelstein, H. Rathore, C. Davis, et al. Comprehensive reliability evaluation of a 90 nm CMOS technology with Cu/PECVD low-k BEOL, in 2004 IEEE International Reliability Physics Symposium. Proceedings, 25 29 April , 2004 IEEE, Phoenix, AZ, USA, p. 316 319].
