Sentence examples for error in the thickness from inspiring English sources

On the other hand, our experimental results revealed that 5%to10%0% of the error in the thickness easily occurred for the designed structure at around 3 nm.

Since the time measurements were accurate to 1 ns (through-transmission) and 2 ns (pulse-echo), the principal cause for the sound speed variations was the error in the thickness measurements, which were performed manually by measuring the displacement of the search tube that held the top transducer from the test fixture.

The wear rate in solution has higher error bar than in air due to the higher error in the layer thickness determination.

In this measurement, the fractional error in the layer thickness can be much larger than the fractional error in the radius with the measurement standard deviation of only 0.9 nm for TEM but at a relatively high value of 5.2 nm for DLS.

In the present work, an error of the thickness estimation in the range of (pm 20 % is expected.

A case study of a typical gas-side particulate fouling system shows that estimating the thickness using the linear profile assumption will lead to a 10% error in the estimated fouling layer thickness.

Since the mean sample thickness was 5.0 mm, the average error in thickness and sound speed would be ± 10%.

Though the complexity of the CP and subplate shape from 20 to 26 GW is much simpler than the convoluted cortex in the mature brain, this full 3D analysis still reduces error in estimating thickness in comparison to extracting 3D meaning from 2D images oriented with respect to a single plane of section (Jones et al. 2000).

For the two layered reconstruction, we found that the error in blood volume increases linearly with error in epidermal thickness assumption (Fig. 7a).

The error in height dependent thickness parameter, daytime underestimation of equatorial drift and contributions of electrons from altitudes above 2000 km have been suggested as the possible causes.

I show that using calibration tests along with special fit algorithms for measured optical spectra provide the relative deposition rates for deposited materials at different substrate points with precision significantly exceeding the error in layer thicknesses of deposited film structure.