The morphology of the obtained material was characterized via transmission electron microscopy (FEI Tecnai F30, Frequency Electronics Inc., Mitchel Field, NY, USA).
High-resolution transmission electron microscopy (HRTEM) (FEI Tecnai F30, Frequency Electronics Inc., Mitchel Field, NY, USA) was employed to examine the morphology of the samples and the size and distribution of the magnetite nanoparticles.
The hydrodynamic sizes of AgNP were measured using a dynamic light scattering (DLS) method (ELS-PT; Otsuka Electronics), and particle characteristics were measured by transmission electron microscopy (TEM, Tecnai 20; Philips, Netherlands).
While using transmission electron microscopy, the important components are vacuum system, an electron optical column, the necessary electronics (the high voltage generator for the electron source and the lens to focus and deflect beams).
The morphologies and the sizes of the prepared MnMNCs were analyzed using high resolution transmission electron microscopy (HR-TEM, JEM-2100 LAB6, JEOL Ltd., Japan) and laser scattering (ELS-Z, Otsuka electronics, Japan).
Besides electrochemical methods such as impedance spectroscopy and cyclic voltammetry, atomic force microscopy (AFM), transmission electron microscopy (TEM) and synchrotron radiation photoelectron spectroscopy (SRPES) have been applied to elucidate the surface chemistry and electronics.
J.R. performed electron microscopy.
K.J. performed electron microscopy.
L.G. performed electron microscopy.
G.E.W. performed electron microscopy.
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