Sentence examples for electron imaging of from inspiring English sources

Optical and electron imaging of deformed lattices show that the deformation largely localizes around the nodes.

For example, graphene can allow electron imaging of nanocrystal nucleation process and water-lattice-structure due to its impermeability.

Electron imaging of the surface coupled with compositional imaging shows that Mn-enriched zones form lacy 2D networks (Fig. 12a, b).

The low vacuum pressure in the sample chamber was reduced until charging levels on the sample surface were reduced to the level at which electron imaging of the sample surface was possible.

The combination of EDX element mapping with low-contrast secondary electron or backscattered electron imaging of a series of parallel cross-sections produced by FIB yield 3D geometrical parameters for the Si which differ from those determined by 2D metallography.

Low-throughput, high-resolution electron imaging of quantum dots in U-2 OS cells is quantified and correlated with high-throughput, low-resolution optical imaging of the nanoparticle-loaded cells.

Our combined methodological approach encompassed atomic force microscopy (AFM) characterization of cortical bone nano-structure, assessment of mineral content/distribution via quantitative backscattered electron imaging (qBEI), measurement of bone material properties by reference point indentation, as well as evaluation of cortical micro-architecture and osteocyte lacunar density.

This book Advances in Imaging and Electronic Physics, Volume 113 discusses electron imaging with three ways of extracting information from an image-forming instrument.

This paper presents results from investigations using state-of-art electron imaging techniques such as Transmission Electron Microscopy (TEM), Electron Backscattered Diffraction (EBSD) and Focused Ion Beam (FIB).

The three-dimensional atomic structure of low-energy NiO ZrO2 cubic) interfaces is determined through a combination of electron imaging and spectroscopy techniques.

The images were acquired using secondary electron imaging at an accelerating voltage of 5 15 kV.