Secondary electron images and backscattered electron images were acquired with a SEM unit (Quanta 200; FEI, Hillsboro, OR, USA), working under the following conditions: 25.0 kV accelerating voltage 90 μA beam current, approximately 1.0 Torr pressure and × 600 nominal magnification.
Secondary electron images and digital image processing were used to characterize the nanoparticle clusters in the solid salt and measure the available nanoparticle surface area.
Back-scattered electron images and energy-dispersive spectrometer analyses in EMP were utilized to determine enrichments of As, Cu, and Zn in pyritic material.
SEM analyses (backscattered electron images and point analyses) were performed with a FE-SEM Zeiss Σigma HD, equipped with an Oxford Instrument X-MaxN 80 SDD detector.
Fig. 1 Painting The Dentist (a), light microscopic image of paint sample taken from the orange skirt, normal light (b) and UV (c); backscatter electron image (d) and part of EDX spectrum (e).
In particular, based on the backscattered electron image analysis and the HYMOSTRUC model, the ITZ microstructure, thickness and porosity are investigated in an elaborative way.
The sintered 0.92 Mg0.95Co0.05 2TiO4 0.08(ceramics.2)TiO3 ceramics were characterized by using X-ray diffraction spectra, scanning electron microscopy (SEM), backscattering electron image (BEI) and energy dispersive X-ray (EDX).
Mechanism of stabilization is studied utilizing advanced techniques, such as the scanning electron microscope (SEM), energy dispersive X-ray analysis (EDX), backscattered electron image (BEI) and X-ray diffraction analysis (XRD).
Photographic records (negatives) were performed on Kodak electron image film and electron micrographs were obtained by scanning of negatives with EPSON 2480 PHOTO scanner.
We took backscattered electron images (BEIs) and made point analyses based on an energy-dispersive X-ray spectroscopy (EDS).
