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Rocket Lab's goal is to build 100 Rutherford engines at its Huntington Beach, CA production facility and HQ, with each Electron equipped with 9 Rutherford's on the first stage and one on the second designed for in-vacuum use.
NanoLC-ESI-IT MS and MS/MS analyses were performed on an ion trap mass spectrometer (LCQ deca XP plus, Thermo electron) equipped with a ESI ion source and on-line coupled to a nano HPLC system (Ultimate, Dionex).
All MS/MS experiments were performed using a Nano- LC/MS system consisting of a Surveyor HPLC system and a 7-tesla Finningan LTQ-FT mass spectrometer (Thermo Electron) equipped with a nano-ESI source.
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The microstructure was visualized using both optical and scanning electron microscopy equipped with electron backscattered diffraction and the global crystallographic texture was measured using X-ray diffraction.
Optical microscopy (OM), X-ray diffractometer (XRD), and scanning electron microscopy equipped with electron dispersive spectroscopy (SEM/EDS) were used to study the morphology, elemental composition, and phase evolution of coatings.
The as-spun hybrid nanofibers were characterized by scanning electron microscopy, transmission electron microscopy equipped with energy dispersive X-ray device and X-ray diffraction pattern.
In the present study, these two significant microstructure factors were evaluated for three types of cast irons with the aid of a scanning electron microscope equipped with of electron back scattered diffraction (EBSD) patterns technique.
The film composition was analyzed for those grown on MgO (001) under the same conditions using a scanning electron microscope equipped with an electron probe microanalyzer (JED-2300F/JSM-6701F, JEOL) and the SFO target as a composition standard.
Electrodes micrographs were acquired with a Carl Zeiss AURIGA Scanning Electron Microscope equipped with a field emission electron gun as electron source and an in-lens detector.
The high-resolution TEM (HRTEM) images were acquired in a JEOL JEM 4010 electron microscope equipped with a LaB6 electron gun at an accelerating voltage of 400 kV.
Cryo-EM images were collected in a Titan Krios 300 kV electron microscope equipped with a direct electron detector (Fig. S2).
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