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The scanning electric microscopy (SEM) images were taken on a JEOL JEM-6700F microscope.
The obtained surfaces were investigated using scanning electric microscopy, energy dispersion spectrum, Fourier transform infrared spectroscopy, X-ray diffraction, and transmission electric microscopy.
The effects of MoO3 and Fe2O3 on the thermal stability of the residue chars were studied using thermogravimetric analysis (TGA), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS) and scanning electric microscopy (SEM).
Electric microscopy showed varied degrees of injury to alveolar epithelium and basement membrane.
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Electric force microscopy.
Electric force microscopy (EFM) was performed at bias voltages of 0 V and 10 V.
The surface potential decay (SPD) of the patterned charges is in situ monitored using electric force microscopy (EFM).
Electric force microscopy (EFM) and its variations offer unique opportunities to deepen our insights into the electrical characteristics of nanostructures.
The T g depression was also observed by utilizing the patterned charges as an indicator using electric force microscopy (EFM) [13].
In this work, we successfully evaluated a series of physical properties of ultrathin polystyrene (PS) films by in situ characterizing the discharging behavior of the patterned charges using electric force microscopy.
The electrochemical properties of o-carboranoyl functionalized graphene oxide was studied using cyclic voltammetry, electrochemical impedance spectroscopy and electric force microscopy.
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