Previous research showed that the magnitude of IAT effects, reliability, and correlations with direct measures remained stable for IATs assigning two or more stimulus exemplars per category (cf. [40], for results on IATs using 1, 2, 4, 6 or 8 items per category).
Psychometric equivalence refers to similarity in psychometric properties such as floor and ceiling effects, reliability and construct validity [ 4].
We analysed acceptance (number of missing values), ceiling and floor effects, reliability (Cronbach's α), factor structure (confirmatory factor analysis), construct validity (correlation with a generic health-related quality of life instrument), and sensitivity to change.
We evaluated floor/ceiling effects, reliability (using Cronbach's alpha, intraclass correlation coefficients (ICC) and measurement error), convergent and divergent construct validity (using four a priori stated hypotheses) and responsiveness (using data obtained prior to and one year after ACLR and described by both effect size (ES) and standardized response mean (SRM)).
It was the aim of this analysis to determine the psychometric properties of the MacNew questionnaire in a large cohort of patients in rehabilitation by testing acceptance, ceiling and floor effects, reliability (internal consistency), factor structure, construct validity, and sensitivity to change.
Data from a cross-sectional survey of 548 elderly individuals were analysed in terms of assumptions of summation of items, floor/ceiling effects, reliability and optimal cut-off score by means of ROC-curve analysis and compared with self-reported insomnia criteria.
Composite materials are often designed using conservative design factors to account for a limited understanding of how multi-scale uncertainties effect reliability.
Different operational issues, such as partial and full testing, are investigated for their effects on reliability of SISs.
We develop an analytic model and demonstrate through testbed measurements with various experimental study methods to show the effects on reliability and accuracy of the throughput estimation.
The LDMOS high electric-field characteristics are explained to the purpose of investigating the effects on reliability and device performance under hot-carrier stress (HCS) conditions.
